6.1.6. What is Process Capability?

6. Process or Product Monitoring and Control
6.1. Introduction

6.1.6. What is Process Capability?

A process capability index uses both the process variability and the process specifications to determine whether the process is "capable"

Process capability compares the output of an in-control process to the specification limits by using capability indices. The comparison is made by forming the ratio of the spread between the process specifications (the specification "width") to the spread of the process values, as measured by 6 process standard deviation units (the process "width").

Process Capability Indices

We are often required to compare the output of a stable process with the process specifications and make a statement about how well the process meets specification. To do this we compare the natural variability of a stable process with the process specification limits.

A capable process is one where almost all the measurements fall inside the specification limits. This can be represented pictorially by the plot below:

There are several statistics that can be used to measure the capability of a process: C_p, C_pk, C_pm.

Most capability indices estimates are valid only if the sample size used is 'large enough'. Large enough is generally thought to be about 50 independent data values.

The C_p, C_pk, and C_pm statistics assume that the population of data values is normally distributed. Assuming a two sided specification, if and and are the mean and standard deviation, respectively, of the normal data and USL, LSL, and T are the upper and lower specification limits and the target value, respectively, then the population capability indices are defined as follows:

Definitions of various process capability indices

Sample estimates of capability indices

Sample estimators for these indices are given below. (Estimators are indicated with a "hat" over them).

The estimator for C_pk can also be expressed as C_pk = C_p(1-k), where k is a scaled distance between the midpoint of the specification range, m, and the process mean,.

Denote the midpoint of the specification range by m = (USL+LSL)/2. The distance between the process mean,, and the optimum, which is m, is - m, where. The scaled distance is

(the absolute sign takes care of the case when.

The estimator for the C_p index, adjusted by the k factor is

Since it follows that .

Plot showing C_p for varying process widths

To get an idea of the value of the C_p for varying process widths, consider the following plot

This can be expressed numerically by the table below:

Translating capability into "rejects"

USL - LSL	6	8	10	12
C_p	1.00	1.33	1.66	2.00
Rejects	.27%	66 ppm	.6 ppm	2 ppb
% of spec used	100	75	60	50

where ppm = parts per million and ppb = parts per billion. Note that the reject figures are based on the assumption that the distribution is centered at.

We have discussed the situation with two spec. limits, the USL and LSL. This is known as the bilateral or two-sided case. There are many cases where only the lower or upper specifications are used. Using one spec limit is called unilateral or one-sided. The corresponding capability indices are

One-sided specifications and the corresponding capability indices

and

where

and

are the process mean and standard deviation, respectively.

Estimates of C_pu and C_pl are obtained by replacing and by and s, respectively. The following relationship holds

C_p = (C_pu + C_pl) /2.

This can be represented pictorially by

Note that we also can write:

C_pk =

{C_pl, C_pu

Confidence Limits For Capability Indices

Confidence intervals for indices

Assuming normally distributed process data, the distribution of the sample

follows from a Chi-square distribution and

and

have distributions related to the non-central t distribution. Fortunately, approximate confidence limits related to the normal distribution have been derived. Various approximations to the distribution of

have also been derived and we will use a normal approximation here, as well.

The resulting formulas for confidence limits are given below:

100(1-)% Confidence Limits for C_p

where

= degrees of freedom

Zhang (1990) derived the exact variance for the estimator of C_pk as well as an approximation for large n. The reference paper is: Zhang, Stenback and Wardrop: Interval Estimation of the process capability index, Communications in Statistics: Theory and Methods, 19(21), 1990, 4455-4470.

The variance is obtained as follows:

Let

Then

His approximation is given by:

where

It is important to note that the sample size should be at least 25 before these approximations are valid. Another point to observe is that variations are not negligible due to the randomness of capability indices.

Capability Index Example

An example

For a certain process the USL = 20 and the LSL = 8. The observed process average,

= 16, and the standard deviation, s = 2. From this we obtain

This means that the process is capable as long as it is located at the midpoint, m = (USL + LSL)/2 = 14.

But it doesn't, since = 16. The factor is found by

and

We would like to have

at least 1.0, so this is not a good process. If possible, reduce the variability or/and center the process. We can compute the

and

From this we see that the

, which is the smallest of the above indices is 0.6667. This verifies that the formula

is the algebraic equivalent of the min{

} definition.

What happens if the process is not normally distributed?

What you can do with non-normal data

The indices that we considered thus far are based on normality of the process distribution. This poses a problem when the process distribution is not normal. Without going into the specifics, we can list some remedies.

Transform the data so that they become approximately normal. A popular transformation is the Box-Cox transformation
Use or develop another set of indices, that apply to nonnormal distributions. One statistic is called C_npk (for non-parametric C_pk). Its estimator is calculated by

There are two flexible families of distributions that are often used: the Pearson and the Johnson families. The sample skewness and kurtosis are used to pick a model and process variability is then estimated.
Use mixture distributions to fit a model to the data. A mixed Poisson model has been used to develop the equivalent of the 4 normality-based capability indices.

There is, of course, much more that can be said about the case of nonnormal data. However, if a Box-Cox transformation can be successfully performed, one is encouraged to use it.