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2. Measurement Process Characterization
2.3. Calibration
2.3.3. What are calibration designs?
2.3.3.2. Solutions to calibration designs

2.3.3.2.1.

General matrix solutions to calibration designs

Requirements Solutions for all designs that are cataloged in this Handbook are included with the designs. Solutions for other designs can be computed from the instructions below given some familiarity with matrices. The matrix manipulations that are required for the calculations are:
  • transposition (indicated by ')
  • multiplication
  • inversion
Notation
  • n = number of difference measurements
  • m = number of artifacts
  • (n - m + 1) = degrees of freedom
  • X= (nxm) design matrix
  • r'= (mx1) vector identifying the restraint
  • ' = (mx1) vector identifying ith item of interest consisting of a 1 in the ith position and zeros elsewhere
  • R*= value of the reference standard
  • Y= (mx1) vector of observed difference measurements
Convention for showing the measurement sequence The convention for showing the measurement sequence is illustrated with the three measurements that make up a 1,1,1 design for 1 reference standard, 1 check standard, and 1 test item. Nominal values are underlined in the first line .
                 1     1     1
          Y(1) = +     -

          Y(2) = +           -

          Y(3) =       +     -


Matrix algebra for solving a design The (mxn) design matrix X is constructed by replacing the pluses (+), minues (-) and blanks with the entries 1, -1, and 0 respectively.

The (mxm) matrix of normal equations, X'X, is formed and augmented by the restraint vector to form an (m+1)x(m+1) matrix, A:

    'X  r'; r 0]
Inverse of design matrix The A matrix is inverted and shown in the form:
    '; h 0]
where Q is an mxm matrix that, when multiplied by s2, yields the usual variance-covariance matrix.
Estimates of values of individual artifacts The least-squares estimates for the values of the individual artifacts are contained in the (mx1) matrix, B, where

'Y + h'R*

where Q is the upper left element of the Ainv matrix shown above. The structure of the individual estimates is contained in the QX' matrix; i.e. the estimate for the ith item can computed from XQ and Yby

  • Cross multiplying the ith column of XQ with Y
  • And adding R*(nominal test)/(nominal restraint)
Clarify with an example We will clarify the above discussion with an example from the mass calibration process at NIST. In this example, two NIST kilograms are compared with a customer's unknown Kilogram.

The design matrix, X, is

Then
    'X = [2  -1 -1; -1  2  -1; -1  -1  2]
If there are three weights with known values for weights one and two, then
    r = [ 1    1    0 ]
Thus
and so
From A-1, we have
We then compute XQ
Standard deviations of estimates The standard deviation for the ith item is:

'*Q*vi*s1**2 + vi'*D*vi*s(days)**2)

where

'*X)*(Q*X'*X)'

The process standard deviation, which is a measure of the overall precision of the (NIST) mass calibrarion process,

'(I - X*Q*X')*Y)
.

is the residual standard deviation from the design, and sdays is the standard deviation for days, which can only be estimated from check standard measurements.

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